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| The present invention relates to optical microscopy, more specifically to a method and an apparatus for determining the fine structure of materials with the aid of scanning laser microscopy. A classical problem of optical microscopy is the observation and investigation of transparent objects or specimens. Phase contrast microscopy in which phase differences in the light passing a specimen are converted into observable amplitude differences is unable to resolve fine differences between inhomogeneities in a transparent medium. Although a scanning optical microscope has achieved superior resolution, it is limited to the observation of certain crystalline materials and other specially structured matter only. The present invention provides a means to overcome the drawbacks and restrictions of these methods and to provide a scanning laser microscope that is capable of producing high-resolution images of specimens of any type of material. This is achieved by providing a method for determining the fine structure of materials by means of a nonlinear scanning laser microscope,present relates optical microscopy specifically apparatus fine structure materials aid scanning laser classical problem microscope observation investigation transparent objects specimens techniques phase information contrast non-observable differences light passing converted amplitude differential interference gives similar results based linear index refraction medium glasses instance differs factor narrow range resolve inhomogeneities close interfaces thin layers embedded media minute respective refractive indices |
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