|
The yet2.com global technology marketplace lists intellectual property, technology, and patents for technology transfer, technology licensing, patent licensing and patent sale. As premier technology brokers, yet2.com offers this essential IP marketplace for technology owners, technology seekers, and technology brokers interested in technology acquisition, patent licensing, intellectual property licensing (IP licensing), and intellectual property transfer.
more...
|
| This is an abstract of a technology that is available for sale or license. yet2.com can introduce you confidentially to the owner of this technology. |
| To view the complete TechPak, please register with us. |
 |
| Enter a keyword or phrase below, and search now to find other technologies of interest. |
|
|
|
|
 |
| The present invention is in the field of high resolution scanning techniques and relates to an apparatus for near-field optical inspection of articles, particularly useful for inspecting a substantially large surface area with very high spatial resolution. There is a great variety of scanning systems having a common goal of increasing the system's resolution. Resolution depends on the diameter of a light beam striking the object, namely the less the diameter of the beam, the higher the resolution of the system. Near-field applications solve the resolution problem by generating a point-like light source, having dimensions smaller than the light wavelength. This is typically achieved either by defining small apertures on opaque screens, or, alternatively, by passing the light through point-like tips of sub-wavelength dimensions. The tips (constituting point-like light sources) are located at very close proximity of the object, in order to provide high optical resolution of the scanning system. The use of a plurality of nano-probes (tips) seems to be the simplest solution to increase both the resolution and the measured area. Unfortunately, this approach does not ensure reproducible results because it scales the cost linearly with the number of probes, wherein each such nano-probe has its own characteristics. The present invention provides an apparatus that enables to obtain simultaneously high-resolution image from a large area and allows for combining the principles of optical and scanning tunneling microscopy for successfully inspecting articles.present field resolution scanning techniques relates apparatus near-field optical inspection articles inspecting large surface area spatial |
|
|
 |
|
Interested? This is an abstract of a technology that is available for sale or license. yet2.com can introduce you confidentially to the owner of this technology.
|
|
To view the complete TechPak, please register with us.
|
|
|
|
