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| A new atomic force microscopy (AFM) probe unit, called point-contact current-imaging AFM (PCI-AFM)-which combines tapping mode (for mapping topographic image) and point-contact operation (for measuring current–voltage characteristics)-has been developed. This new AFM probe unit can simultaneously map high-resolution topographic image and measure spatially resolved I–V characteristics of materials (placed on an insulative substrate and connected to a gold electrode) on the nanoscale. The high performance of the PCI-AFM probe unit is demonstrated in experiments on a variety of materials such as carbonnanotubes (CNTs), DNAs etc.INSTRUMENTATION TESTING atomic force microscope probe unit tapping mode measurement point contact alternatively carried advance measurements switched every predetermined time pixels software Preferred Probe Units switching signal excitation reverse phase transition applied cantilever optionally certain amount sample direction axis set specific loaded state feedback loop frozen preserve value preserved restart interval 10-20 ms FIG1 diagram showing general device embodiment present |
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